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  • Precise and Accurate Measurements of Strong-Field Photoionization and a Transferable Laser Intensity Calibration Standard

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    Accepted Manuscript (AM)
    Author(s)
    Wallace, WC
    Ghafur, O
    Khurmi, C
    Sainadh, Satya U
    Calvert, JE
    Laban, DE
    Pullen, MG
    Bartschat, K
    Grum-Grzhimailo, AN
    Wells, D
    Quiney, HM
    Tong, XM
    Litvinyuk, IV
    Sang, RT
    Kielpinski, D
    Griffith University Author(s)
    Sang, Robert T.
    Litvinyuk, Igor
    Year published
    2016
    Metadata
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    Abstract
    Ionization of atoms and molecules in strong laser fields is a fundamental process in many fields of research, especially in the emerging field of attosecond science. So far, demonstrably accurate data have only been acquired for atomic hydrogen (H), a species that is accessible to few investigators. Here, we present measurements of the ionization yield for argon, krypton, and xenon with percent-level accuracy, calibrated using H, in a laser regime widely used in attosecond science. We derive a transferable calibration standard for laser peak intensity, accurate to 1.3%, that is based on a simple reference curve. In addition, ...
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    Ionization of atoms and molecules in strong laser fields is a fundamental process in many fields of research, especially in the emerging field of attosecond science. So far, demonstrably accurate data have only been acquired for atomic hydrogen (H), a species that is accessible to few investigators. Here, we present measurements of the ionization yield for argon, krypton, and xenon with percent-level accuracy, calibrated using H, in a laser regime widely used in attosecond science. We derive a transferable calibration standard for laser peak intensity, accurate to 1.3%, that is based on a simple reference curve. In addition, our measurements provide a much needed benchmark for testing models of ionization in noble-gas atoms, such as the widely employed single-active electron approximation.
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    Journal Title
    Physical Review Letters
    Volume
    117
    Issue
    5
    DOI
    https://doi.org/10.1103/PhysRevLett.117.053001
    Copyright Statement
    © 2016 American Physical Society. This is the author-manuscript version of this paper. Reproduced in accordance with the copyright policy of the publisher. Please refer to the journal's website for access to the definitive, published version.
    Subject
    Mathematical sciences
    Physical sciences
    Other physical sciences not elsewhere classified
    Engineering
    Publication URI
    http://hdl.handle.net/10072/100328
    Collection
    • Journal articles

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