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dc.contributor.authorWallace, WC
dc.contributor.authorGhafur, O
dc.contributor.authorKhurmi, C
dc.contributor.authorSainadh, Satya U
dc.contributor.authorCalvert, JE
dc.contributor.authorLaban, DE
dc.contributor.authorPullen, MG
dc.contributor.authorBartschat, K
dc.contributor.authorGrum-Grzhimailo, AN
dc.contributor.authorWells, D
dc.contributor.authorQuiney, HM
dc.contributor.authorTong, XM
dc.contributor.authorLitvinyuk, IV
dc.contributor.authorSang, RT
dc.contributor.authorKielpinski, D
dc.date.accessioned2018-03-08T04:53:02Z
dc.date.available2018-03-08T04:53:02Z
dc.date.issued2016
dc.identifier.issn0031-9007
dc.identifier.doi10.1103/PhysRevLett.117.053001
dc.identifier.urihttp://hdl.handle.net/10072/100328
dc.description.abstractIonization of atoms and molecules in strong laser fields is a fundamental process in many fields of research, especially in the emerging field of attosecond science. So far, demonstrably accurate data have only been acquired for atomic hydrogen (H), a species that is accessible to few investigators. Here, we present measurements of the ionization yield for argon, krypton, and xenon with percent-level accuracy, calibrated using H, in a laser regime widely used in attosecond science. We derive a transferable calibration standard for laser peak intensity, accurate to 1.3%, that is based on a simple reference curve. In addition, our measurements provide a much needed benchmark for testing models of ionization in noble-gas atoms, such as the widely employed single-active electron approximation.
dc.description.peerreviewedYes
dc.languageEnglish
dc.language.isoeng
dc.publisherAmerican Physical Society
dc.relation.ispartofpagefrom053001-1
dc.relation.ispartofpageto053001-5
dc.relation.ispartofissue5
dc.relation.ispartofjournalPhysical Review Letters
dc.relation.ispartofvolume117
dc.subject.fieldofresearchPhysical Sciences not elsewhere classified
dc.subject.fieldofresearchMathematical Sciences
dc.subject.fieldofresearchPhysical Sciences
dc.subject.fieldofresearchEngineering
dc.subject.fieldofresearchcode029999
dc.subject.fieldofresearchcode01
dc.subject.fieldofresearchcode02
dc.subject.fieldofresearchcode09
dc.titlePrecise and Accurate Measurements of Strong-Field Photoionization and a Transferable Laser Intensity Calibration Standard
dc.typeJournal article
dc.type.descriptionC1 - Articles
dc.type.codeC - Journal Articles
dc.description.versionAccepted Manuscript (AM)
gro.facultyGriffith Sciences, School of Natural Sciences
gro.rights.copyright© 2016 American Physical Society. This is the author-manuscript version of this paper. Reproduced in accordance with the copyright policy of the publisher. Please refer to the journal's website for access to the definitive, published version.
gro.hasfulltextFull Text
gro.griffith.authorSang, Robert T.
gro.griffith.authorLaban, Dane E.
gro.griffith.authorCalvert, James E.
gro.griffith.authorWallace, William C.
gro.griffith.authorKielpinski, David
gro.griffith.authorPullen, Michael
gro.griffith.authorLitvinyuk, Igor
gro.griffith.authorGhafur, Omair
gro.griffith.authorBartschat, Klaus
gro.griffith.authorKhurmi, Champak
gro.griffith.authorUndurti, Satya Sainadh S.


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