Spectral signature of single-grain quartz using a high-sensitivity TL imaging system

Abstract

The spectral signature of individual quartz grains were measured using a high-sensitivity thermoluminescence imaging system based on a charge-coupled device (CCD) camera and custom optics. Luminescence emission behaviour was characterised for individual quartz grains (180–212 μm), with single grains shown to emit luminescence strongly across multiple signal bands. The spectral profiles of three quartz samples from contrasting geological contexts were then compared, with clear distinction in the spectral signatures of individual grains originating from single deposits within each provenance.