Spectral signature of single-grain quartz using a high-sensitivity TL imaging system
Author(s)
Borombovits, DK
Streed, EW
Pietsch, TJ
Olley, JM
Year published
2016
Metadata
Show full item recordAbstract
The spectral signature of individual quartz grains were measured using a high-sensitivity thermoluminescence imaging system based on a charge-coupled device (CCD) camera and custom optics. Luminescence emission behaviour was characterised for individual quartz grains (180–212 μm), with single grains shown to emit luminescence strongly across multiple signal bands. The spectral profiles of three quartz samples from contrasting geological contexts were then compared, with clear distinction in the spectral signatures of individual grains originating from single deposits within each provenance.The spectral signature of individual quartz grains were measured using a high-sensitivity thermoluminescence imaging system based on a charge-coupled device (CCD) camera and custom optics. Luminescence emission behaviour was characterised for individual quartz grains (180–212 μm), with single grains shown to emit luminescence strongly across multiple signal bands. The spectral profiles of three quartz samples from contrasting geological contexts were then compared, with clear distinction in the spectral signatures of individual grains originating from single deposits within each provenance.
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Journal Title
Radiation Measurements
Volume
98
Subject
Atomic, molecular and optical physics
Atomic, molecular and optical physics not elsewhere classified
Other physical sciences
Geology
Geophysics not elsewhere classified
Soil physics