Low Specific Contact Resistivity Nickel to Silicon Carbide Determined Using a Two Contact Circular Test Structure

Pan, Yue; Collins, Aaron M; Leech, Patrick W; Reeves, Geoffrey K; Holland, Anthony S; Tanner, Philip

doi:10.1109/ICMTS.2014.6841471

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Author(s)

Pan, Yue

Collins, Aaron M

Leech, Patrick W

Reeves, Geoffrey K

Holland, Anthony S

Tanner, Philip

Griffith University Author(s)

Tanner, Philip G.

Year published

2014

Metadata

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Conference Title

2014 IEEE INTERNATIONAL CONFERENCE ON MICROELECTRONIC TEST STRUCTURES (ICMTS)

DOI

https://doi.org/10.1109/ICMTS.2014.6841471

Copyright Statement

© 2014 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.

Subject

Biomedical Instrumentation

Publication URI

http://hdl.handle.net/10072/112692

Collection

Conference outputs