Low Specific Contact Resistivity Nickel to Silicon Carbide Determined Using a Two Contact Circular Test Structure

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Author(s)
Pan, Yue
Collins, Aaron M
Leech, Patrick W
Reeves, Geoffrey K
Holland, Anthony S
Tanner, Philip
Griffith University Author(s)
Year published
2014
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Conference Title
2014 IEEE INTERNATIONAL CONFERENCE ON MICROELECTRONIC TEST STRUCTURES (ICMTS)
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Biomedical Instrumentation
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