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  • Low Specific Contact Resistivity Nickel to Silicon Carbide Determined Using a Two Contact Circular Test Structure

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    103253_1.pdf (690.9Kb)
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    Accepted Manuscript (AM)
    Author(s)
    Pan, Yue
    Collins, Aaron M
    Leech, Patrick W
    Reeves, Geoffrey K
    Holland, Anthony S
    Tanner, Philip
    Griffith University Author(s)
    Tanner, Philip G.
    Year published
    2014
    Metadata
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    Conference Title
    2014 IEEE INTERNATIONAL CONFERENCE ON MICROELECTRONIC TEST STRUCTURES (ICMTS)
    DOI
    https://doi.org/10.1109/ICMTS.2014.6841471
    Copyright Statement
    © 2014 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.
    Subject
    Biomedical instrumentation
    Publication URI
    http://hdl.handle.net/10072/112692
    Collection
    • Conference outputs

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