Lateral Force Microscopy - A Quantative Approach

Abstract

The requirements for placing lateral force microscopy (LFM) on a quantitative basis are considered, with a view to enhancing the prospects for application in nanotribology. Methods for determining the critical parameters of the LFM system are reviewed and discussed (e.g. tip shape, detector sensitivity, normal and lateral spring constants of the force-sensing/loading lever, effective normal and lateral forces, and influence of topography). The emphasis is on exploitation of the capabilities inherent in the AFM/LFM system so as to obtain the relevant parameters and variables in situ during the conduct of an experiment.