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dc.contributor.authorJames, Danielen_US
dc.contributor.authorO'Keefe, Stevenen_US
dc.contributor.authorThiel, Daviden_US
dc.date.accessioned2017-05-03T13:45:53Z
dc.date.available2017-05-03T13:45:53Z
dc.date.issued1999en_US
dc.date.modified2010-10-12T06:54:17Z
dc.identifier.issn00189464en_US
dc.identifier.doi10.1109/20.767140en_AU
dc.identifier.urihttp://hdl.handle.net/10072/12308
dc.description.abstractIn this paper a new technique for determining surface impedance is developed. The technique is derived from an eddy current modelling technique, the impedance method. Considerable extension and development of the impedance method has been undertaken, enabling the prediction of surface impedance measurements for horizontally stratified media and in the vicinity of vertical dislocations. The method is compared with surface impedance theory for horizontally stratified media and with field based results near laterally discontinuous structuresen_US
dc.description.peerreviewedYesen_US
dc.description.publicationstatusYesen_AU
dc.format.extent323598 bytes
dc.format.extent10790 bytes
dc.format.mimetypeapplication/pdf
dc.format.mimetypetext/plain
dc.languageEnglishen_US
dc.language.isoen_AU
dc.publisherInstitute of Electrical and Electronics Engineersen_US
dc.publisher.placeUSAen_US
dc.relation.ispartofpagefrom1107en_US
dc.relation.ispartofpageto1110en_US
dc.relation.ispartofissue3en_US
dc.relation.ispartofjournalIEEE Transactions on Magneticsen_US
dc.relation.ispartofvolume35en_US
dc.subject.fieldofresearchcode290903en_US
dc.titleEddy Current Modelling Using the Impedance Method for Surface Impedance Profilingen_US
dc.typeJournal articleen_US
dc.type.descriptionC1 - Peer Reviewed (HERDC)en_US
dc.type.codeC - Journal Articlesen_US
gro.rights.copyrightCopyright 1999 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.en_AU
gro.date.issued1999
gro.hasfulltextFull Text


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