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dc.contributor.authorWang, Bin
dc.contributor.authorGao, Yongsheng
dc.contributor.editorJean-Philippe Thiran, Fabrice Labeau
dc.date.accessioned2018-04-17T01:30:31Z
dc.date.available2018-04-17T01:30:31Z
dc.date.issued2015
dc.identifier.isbn9781479983391
dc.identifier.issn1522-4880
dc.identifier.doi10.1109/ICIP.2015.7350902
dc.identifier.urihttp://hdl.handle.net/10072/123465
dc.description.abstractA novel shape descriptor, termed multi-scale bisector integrals, is proposed in this paper. Different from the existing Radon transform based descriptors which integrate the shape image function over all the possible lines in its domain, the proposed method restrains the integrals only over a special class of lines, termed shape bisectors, for characterizing the essence of the shape. Integrating the shape image over the multi-orders of shape bisectors yields a multi-scale descriptor. The proposed descriptor is completely invariant to translation, scaling and rotation. The experimental results on the standard MEPG-7 CE-2 shape database demonstrate its superiority over the state-of-the-art approaches.
dc.description.peerreviewedYes
dc.languageEnglish
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE)
dc.publisher.placeUnited States
dc.relation.ispartofconferencenameIEEE International Conference on Image Processing (ICIP)
dc.relation.ispartofconferencetitle2015 IEEE INTERNATIONAL CONFERENCE ON IMAGE PROCESSING (ICIP)
dc.relation.ispartofdatefrom2015-09-27
dc.relation.ispartofdateto2015-09-30
dc.relation.ispartoflocationQuebec City, CANADA
dc.relation.ispartofpagefrom765
dc.relation.ispartofpageto769
dc.relation.ispartofvolume2015-December
dc.subject.fieldofresearchImage Processing
dc.subject.fieldofresearchcode080106
dc.titleMulti-scale bisector integrals: An invariant descriptor for accurate shape retrieval
dc.typeConference output
dc.type.descriptionE1 - Conferences
dc.type.codeE - Conference Publications
gro.hasfulltextNo Full Text
gro.griffith.authorGao, Yongsheng
gro.griffith.authorWang, Bin


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