Piezoresistive effect of p-type single crystalline 3C-SiC on (111) plane
Author(s)
Dao, Dzung Viet
Phan, Hoang-Phuong
Qamar, Afzaal
Dinh, Toan
Griffith University Author(s)
Year published
2016
Metadata
Show full item recordAbstract
This paper presents for the first time the effect of strain on the electrical conductivity of p-type single crystalline 3C–SiC grown on a Si (111) substrate. 3C–SiC thin film was epitaxially formed on a Si (111) substrate using the low pressure chemical vapor deposition process. The piezoresistive effect of the grown film was investigated using the bending beam method. The average longitudinal gauge factor of the p-type single crystalline 3C–SiC was found to be around 11 and isotropic in the (111) plane. This gauge factor is 3 times smaller than that in a p-type 3C–SiC (100) plane. This reduction of the gauge factor was ...
View more >This paper presents for the first time the effect of strain on the electrical conductivity of p-type single crystalline 3C–SiC grown on a Si (111) substrate. 3C–SiC thin film was epitaxially formed on a Si (111) substrate using the low pressure chemical vapor deposition process. The piezoresistive effect of the grown film was investigated using the bending beam method. The average longitudinal gauge factor of the p-type single crystalline 3C–SiC was found to be around 11 and isotropic in the (111) plane. This gauge factor is 3 times smaller than that in a p-type 3C–SiC (100) plane. This reduction of the gauge factor was attributed to the high density of defects in the grown 3C–SiC (111) film. Nevertheless, the gauge factor of the p-type 3C–SiC (111) film is still approximately 5 times higher than that in most metals, indicating its potential for niche mechanical sensing applications.
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View more >This paper presents for the first time the effect of strain on the electrical conductivity of p-type single crystalline 3C–SiC grown on a Si (111) substrate. 3C–SiC thin film was epitaxially formed on a Si (111) substrate using the low pressure chemical vapor deposition process. The piezoresistive effect of the grown film was investigated using the bending beam method. The average longitudinal gauge factor of the p-type single crystalline 3C–SiC was found to be around 11 and isotropic in the (111) plane. This gauge factor is 3 times smaller than that in a p-type 3C–SiC (100) plane. This reduction of the gauge factor was attributed to the high density of defects in the grown 3C–SiC (111) film. Nevertheless, the gauge factor of the p-type 3C–SiC (111) film is still approximately 5 times higher than that in most metals, indicating its potential for niche mechanical sensing applications.
View less >
Journal Title
RSC Advances
Volume
6
Issue
26
Subject
Chemical sciences
Microelectronics