Border Trap Characterisation by Measurements of Current-Voltage Characteristics of MOS Capacitors

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Author(s)
Dimitrijev, S
Tanner, P
Yao, ZQ
Harrison, HB
Year published
1995
Metadata
Show full item recordConference Title
Proceedings of the International Conference on Microelectronics
Volume
1
Copyright Statement
© 1995 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.
Subject
Environmental sciences