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dc.contributor.authorRowlands, Daviden_US
dc.contributor.authorDimitrijev, Simaen_US
dc.contributor.editorIEEE Hong Kong Section & IEEE Asia-Pacific Regionen_US
dc.date.accessioned2017-04-24T14:30:05Z
dc.date.available2017-04-24T14:30:05Z
dc.date.issued1995en_US
dc.date.modified2008-09-10T06:04:53Z
dc.identifier.doihttp://ieeexplore.ieee.org/xpl/tocresult.jsp?isnumber=10682&isYear=1995en_AU
dc.identifier.urihttp://hdl.handle.net/10072/19922
dc.description.abstractFluctuations in the processing parameters can lead to a separation between the gate and the sourceldrain extensions in MOSFETs. A O.l堍OSFET was simulated with 5%, and 10% separation and it was found that the transconductance was reduced, the threshold voltage was not significantly changed, and that there was no effect on the breakdown because the device has suffered punchthrough rather than avalanche breakdown.en_US
dc.description.publicationstatusYesen_AU
dc.format.extent10432 bytes
dc.format.extent258596 bytes
dc.format.mimetypetext/plain
dc.format.mimetypeapplication/pdf
dc.languageEnglishen_US
dc.language.isoen_AU
dc.publisherIEEEen_US
dc.publisher.placeHong Kongen_US
dc.publisher.urihttp://www.ieee.org/portal/siteen_AU
dc.relation.ispartofconferencenameIEEE TENCON IEEE Region 10 International Conference on Microelectronics and VLSIen_US
dc.relation.ispartofconferencetitle1995 IEEE TENCON IEEE Region 10 International Conference on Microelectronics and VLSIen_US
dc.relation.ispartofdatefrom1995-11-06en_US
dc.relation.ispartofdateto1995-11-10en_US
dc.relation.ispartoflocationHong Kongen_US
dc.subject.fieldofresearchBIOLOGICAL SCIENCESen_US
dc.subject.fieldofresearchcode060000en_US
dc.titleEffects of Processing Fluctuations on a 0.1µ MOSFETen_US
dc.typeConference outputen_US
dc.type.descriptionE2 - Conference Publications (Non HERDC Eligible)en_US
dc.type.codeE - Conference Publicationsen_US
gro.facultyGriffith Sciences, Griffith School of Engineeringen_US
gro.rights.copyrightCopyright 1995 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.en_AU
gro.date.issued1995
gro.hasfulltextFull Text


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    Contains papers delivered by Griffith authors at national and international conferences.

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