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dc.contributor.authorThiel, Daviden_US
dc.date.accessioned2017-05-03T11:03:44Z
dc.date.available2017-05-03T11:03:44Z
dc.date.issued2008en_US
dc.date.modified2009-10-02T06:02:39Z
dc.identifier.doi10.1109/APS.2008.4619003en_US
dc.identifier.urihttp://hdl.handle.net/10072/20620
dc.description.abstractThis simple investigation, and results from many other experimental measurements and theoretical investigations demonstrate the following: a) There is a region close to the parasitic element where the electric field strength is greatly reduced and the magnetic field is greatly increased. b) The spatial rate of change of the field strength is very high. Small changes in distance can result in very large changes in electric field strength. This effect is observed in many transmitter situations. c) The presence of an additional conductor in this zone will influence the near fields and so can influence the overall effectiveness of the antenna. These conclusions are important because: a) Grounded towers used in VLF, LF and HF antennas show small regions where the measured and modeled quasi-static fields are greatly reduced. Such regions might be defined as "safe" when radiation exposure standards [6] are applied. b) The near field zone immediately behind Yagi-Uda antennas is not as "safe" as that predicted from far field to near field transform approximations (Ebersbach, Thiel and Leckenby [4]). c) Antenna isolation from nearby conductors using parasitic elements placed close to the driven elements is not particularly effective when compared to a large reflecting screen.en_US
dc.description.publicationstatusYesen_AU
dc.format.extent379638 bytes
dc.format.mimetypeapplication/pdf
dc.languageEnglishen_US
dc.language.isoen_AU
dc.publisherIEEEen_US
dc.publisher.placePiscataway USAen_US
dc.relation.ispartofstudentpublicationNen_AU
dc.relation.ispartofconferencenameIEEE APS International Symposiumen_US
dc.relation.ispartofconferencetitleIEEE Antennas and Propagation Society International Symposiumen_US
dc.relation.ispartofdatefrom2008-07-05en_US
dc.relation.ispartofdateto2008-07-11en_US
dc.relation.ispartoflocationSan Diego, CA USAen_US
dc.rights.retentionYen_AU
dc.subject.fieldofresearchcode291701en_US
dc.titleExposure zones near parasitic elements in high powered antennasen_US
dc.typeConference outputen_US
dc.type.descriptionE2 - Conference Publications (Non HERDC Eligible)en_US
dc.type.codeE - Conference Publicationsen_US
gro.facultyGriffith Sciences, Griffith School of Engineeringen_US
gro.rights.copyrightCopyright 2008 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.en_AU
gro.date.issued2008
gro.hasfulltextFull Text


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    Contains papers delivered by Griffith authors at national and international conferences.

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