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dc.contributor.convenorProf. Dr. N. Stojadinovic
dc.contributor.authorKong, F
dc.contributor.authorTanner, P
dc.contributor.authorHold, L
dc.contributor.authorHan, J
dc.contributor.authorDimitrijev, S
dc.date.accessioned2017-05-03T15:10:20Z
dc.date.available2017-05-03T15:10:20Z
dc.date.issued2006
dc.date.modified2009-09-16T07:42:44Z
dc.identifier.isbn9781424401178
dc.identifier.issn2159-1660
dc.identifier.refurihttp://ieeexplore.ieee.org/xpl/tocresult.jsp?isnumber=34620&isYear=2006
dc.identifier.doi10.1109/ICMEL.2006.1651017
dc.identifier.urihttp://hdl.handle.net/10072/22854
dc.description.abstractThis paper demonstrates the extraction of MOS capacitor minority carrier generation lifetime and surface generation velocity from the measurement of deep-depletion capacitance transient. It is shown that the bulk generation lifetime, the lateral surface generation, and the surface generation under the gate can be separately determined by measuring test structures with different perimeter-to-area ratios.
dc.description.peerreviewedYes
dc.description.publicationstatusYes
dc.format.extent208089 bytes
dc.format.mimetypeapplication/pdf
dc.languageEnglish
dc.language.isoeng
dc.publisherIEEE
dc.publisher.placeUSA
dc.publisher.urihttp://ieeexplore.ieee.org/xpl/tocresult.jsp?isnumber=34620&isYear=2006
dc.relation.ispartofstudentpublicationN
dc.relation.ispartofconferencename25th International Conference on Microelectronics
dc.relation.ispartofconferencetitle2006 25TH INTERNATIONAL CONFERENCE ON MICROELECTRONICS, VOLS 1 AND 2, PROCEEDINGS
dc.relation.ispartofdatefrom2006-05-14
dc.relation.ispartofdateto2006-05-17
dc.relation.ispartoflocationBelgrade, SERBIA MONTENEG
dc.relation.ispartofpagefrom557
dc.relation.ispartofpagefrom2 pages
dc.relation.ispartofpageto+
dc.relation.ispartofpageto2 pages
dc.rights.retentionY
dc.subject.fieldofresearchcode290901
dc.titleAnalysis of surface generation mechanisms in MOS capacitors
dc.typeConference output
dc.type.descriptionE1 - Conferences
dc.type.codeE - Conference Publications
gro.facultyGriffith Sciences, Griffith School of Engineering
gro.rights.copyright© 2006 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.
gro.date.issued2006
gro.hasfulltextFull Text
gro.griffith.authorDimitrijev, Sima
gro.griffith.authorTanner, Philip G.


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    Contains papers delivered by Griffith authors at national and international conferences.

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