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dc.contributor.authorChapman, Justinen_US
dc.contributor.authorNorton, Benen_US
dc.contributor.authorStreed, Eriken_US
dc.contributor.authorKielpinski, Daviden_US
dc.date.accessioned2017-05-03T15:05:42Z
dc.date.available2017-05-03T15:05:42Z
dc.date.issued2008en_US
dc.date.modified2011-11-22T04:14:07Z
dc.identifier.issn00346748en_US
dc.identifier.doi10.1063/1.2991112en_AU
dc.identifier.urihttp://hdl.handle.net/10072/23491
dc.description.peerreviewedYesen_US
dc.description.publicationstatusYesen_AU
dc.languageEnglishen_US
dc.language.isoen_AU
dc.publisherAmerican Institute of Physicsen_US
dc.publisher.placeMelville, NYen_US
dc.relation.ispartofstudentpublicationYen_AU
dc.relation.ispartofpagefrom095106-1en_US
dc.relation.ispartofpageto095106-4en_US
dc.relation.ispartofjournalReview of Scientific Instrumentsen_US
dc.relation.ispartofvolume79en_US
dc.rights.retentionYen_AU
dc.subject.fieldofresearchcode204301en_US
dc.titleAn automated submicron beam profiler for characterization of high numerical aperture opticsen_US
dc.typeJournal articleen_US
dc.type.descriptionC1 - Peer Reviewed (HERDC)en_US
dc.type.codeC - Journal Articlesen_US
gro.date.issued2008
gro.hasfulltextNo Full Text


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