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dc.contributor.convenorJohn M Bellen_AU
dc.contributor.authorMacnamara, Dwainen_US
dc.contributor.authorThiel, Daviden_US
dc.contributor.authorJames, Danielen_US
dc.contributor.authorLisner, Peteren_US
dc.contributor.editorAlex J. Harizen_US
dc.date.accessioned2017-05-03T11:30:03Z
dc.date.available2017-05-03T11:30:03Z
dc.date.issued2005en_US
dc.date.modified2009-11-30T05:24:00Z
dc.identifier.doi10.1117/12.650131en_AU
dc.identifier.urihttp://hdl.handle.net/10072/2619
dc.description.abstractThis paper reviews current piezo-resistive characteristics pertaining to conventional and novel piezo-resistive strain transducers. These characteristics govern the performance of the sensor node. In this application, low power consumption, high signal to noise ratio (SNR), sensitivity and resolution in the sensor node are optimized for a distributed sensor network. In this low frequency application at < 100 Hz, it is found that electrical noise can limit the nominal resistance of the strain gauge to be used. By reducing the nominal resistance to lower the SNR, power consumption is increased. Optimization of the nominal resistance for excess noise and other material parameters must take place. Typical values have been used to explore the SNR over a range of resistance values and against frequency. The trade-off is also optimized in the volume and sheet resistance of the piezo-resistive material. Irreversible phenomena such as ageing and material creep are responsible for very low frequency drift (approaching DC) with respect to time and temperature. It is found that this drift is material specific and can be numerically compensated in situ. Maximizing sensitivity of the transducer is desirable to reduce the overhead at the sensor front-end. This overhead is shown to be dependant on gauge factor and the configuration of the strain-sensing circuit. The configuration of the strain-sensing circuit impacts on cost, complexity and SNR.en_US
dc.description.peerreviewedYesen_US
dc.description.publicationstatusYesen_AU
dc.languageEnglishen_US
dc.language.isoen_AU
dc.publisherSPIEen_US
dc.publisher.placeUSAen_US
dc.publisher.urihttp://spiedl.aip.org/dbt/dbt.jsp?KEY=PSISDG&Volume=6035&Issue=1en_AU
dc.relation.ispartofstudentpublicationYen_AU
dc.relation.ispartofconferencenameMicroelectronics: Design, Technology and Packaging IIen_US
dc.relation.ispartofconferencetitleSPIE International Symposium on Microelectronics, MEMs and Nanotechnologyen_US
dc.relation.ispartofdatefrom2005-12-12en_US
dc.relation.ispartofdateto2005-12-14en_US
dc.relation.ispartoflocationBrisbaneen_US
dc.rights.retentionYen_AU
dc.subject.fieldofresearchcode290902en_US
dc.titleOptimizing piezo-resistive strain gauge characteristics for intelligent strain sensing applicationsen_US
dc.typeConference outputen_US
dc.type.descriptionE1 - Conference Publications (HERDC)en_US
dc.type.codeE - Conference Publicationsen_US
gro.facultyGriffith Sciences, Griffith School of Engineeringen_US
gro.date.issued2005
gro.hasfulltextNo Full Text


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    Contains papers delivered by Griffith authors at national and international conferences.

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