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dc.contributor.authorThiel, DV
dc.date.accessioned2017-05-03T13:29:26Z
dc.date.available2017-05-03T13:29:26Z
dc.date.issued2000
dc.date.modified2010-10-12T06:55:50Z
dc.identifier.issn0018-926X
dc.identifier.doi10.1109/8.899667
dc.identifier.urihttp://hdl.handle.net/10072/3050
dc.description.abstractElectromagnetic (EM) surface impedance, defined as the ratio of the horizontal electric field to the horizontal magnetic field perpendicular to the plane of incidence, has been used in geophysics since the early 1950s for subsurface earth mapping. Traditionally, the electric field component has been measured using a staked voltage probe. In 1989, Wu and Thiel suggested that an insulated wire dipole without the stakes was a more reliable measurement technique. Wait (1989) responded to this paper and the discussion continued until Wait's last comments were published in 1999. In this paper, the final arguments are summarized. The major conclusion reached is that either technique can be used provided caution is exercised, particularly at higher frequencies
dc.description.peerreviewedYes
dc.description.publicationstatusYes
dc.format.extent50250 bytes
dc.format.extent21280 bytes
dc.format.mimetypeapplication/pdf
dc.format.mimetypetext/plain
dc.languageEnglish
dc.language.isoeng
dc.publisherInstitute of Electrical and Electronics Engineers
dc.publisher.placeUSA
dc.relation.ispartofpagefrom1517
dc.relation.ispartofpageto1520
dc.relation.ispartofissue10
dc.relation.ispartofjournalIEEE Transactions on Antennas and Propagation
dc.relation.ispartofvolume48
dc.subject.fieldofresearchCommunications engineering
dc.subject.fieldofresearchHistory, heritage and archaeology
dc.subject.fieldofresearchcode4006
dc.subject.fieldofresearchcode43
dc.titleOn measuring electromagnetic surface impedance - Discussions with Professor James R. Wait
dc.typeJournal article
dc.type.descriptionC1 - Articles
dc.type.codeC - Journal Articles
gro.facultyGriffith Sciences, Griffith School of Engineering
gro.rights.copyright© 2000 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.
gro.date.issued2000
gro.hasfulltextFull Text
gro.griffith.authorThiel, David V.


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