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dc.contributor.authorDong, Jie
dc.contributor.authorWang, Li
dc.contributor.authorHu, Xiaobu
dc.contributor.authorLi, Xianxiang
dc.contributor.authorLi, Juan
dc.contributor.authorJiang, Shouzheng
dc.contributor.authorChen, Xiufang
dc.contributor.authorXu, Xiangang
dc.contributor.authorJiang, Minhua
dc.contributor.editorRobert P. Devaty, David J. Larkin and Stephen E. Saddow
dc.date.accessioned2017-05-12T00:15:32Z
dc.date.available2017-05-12T00:15:32Z
dc.date.issued2006
dc.date.modified2010-07-29T08:19:38Z
dc.identifier.urihttp://hdl.handle.net/10072/32932
dc.description.abstract4H-SiC single crystal with a diameter of 1.5'' has been grown by the seed sublimation method. Regions of mixed polytypes are assessed by high resolution X-ray diffractometry with the asymmetrical diffraction geometry. Multiple reflections are observed from the rocking curve measurements of a longitudinal cut 4H-SiC slice. Those reflections are indexed to be 2131 and 2131 of 4H-SiC, 2130 , 2131 , 2131 , 2132 and 2132 of 6H-SiC, 2131 , 2132 , 2134 , 2135 and 2137 of 15R-SiC respectively based on the lattice constants of different polytypes in SiC crystal. It is believed that the polytypes can be identified by high resolution X-ray diffractometry.
dc.description.peerreviewedYes
dc.description.publicationstatusYes
dc.languageEnglish
dc.language.isoeng
dc.publisherTrans Tech Publications
dc.publisher.placeSwitzerland
dc.publisher.urihttp://www.ttp.net/978-0-87849-442-2.html
dc.relation.ispartofstudentpublicationY
dc.relation.ispartofconferencenameSilicon Carbide and Related Materials 2005 (ICSCRM 2005)
dc.relation.ispartofconferencetitleSilicon Carbide and Related Materials
dc.relation.ispartofdatefrom2005-09-18
dc.relation.ispartofdateto2005-09-23
dc.relation.ispartoflocationPittsburgh, Pennsylvania, USA,
dc.rights.retentionY
dc.subject.fieldofresearchSurfaces and Structural Properties of Condensed Matter
dc.subject.fieldofresearchPhysical Chemistry (incl. Structural)
dc.subject.fieldofresearchMaterials Engineering
dc.subject.fieldofresearchcode020406
dc.subject.fieldofresearchcode0306
dc.subject.fieldofresearchcode0912
dc.titleIdentification of Polytypes in Sublimation Grown 4H-SiC Crystals by High Resolution X-Ray Diffractometry
dc.typeConference output
dc.type.descriptionE1 - Conferences
dc.type.codeE - Conference Publications
gro.date.issued2006
gro.hasfulltextNo Full Text
gro.griffith.authorWang, Li


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