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  • Inter-image outliers and their application to image classification

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    64724_2.pdf (4.393Mb)
    Author(s)
    James, Alex Pappachen
    Dimitrijev, Sima
    Griffith University Author(s)
    Dimitrijev, Sima
    James, Alex P.
    Year published
    2010
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    Abstract
    Image variability that is impossible or difficult to restore by intra-image processing, such as the variability caused by occlusions, significantly reduces the performance of image-recognition methods. To address this issue, we propose that the pixels associated with large distances obtained by inter-image pixel-by-pixels comparisons should be considered as inter-image outliers and should be removed from the similarity calculation used for the image classification. When this method is combined with the template-matching method for image recognition, it leads to state-of-the-art recognition performance: 91% with AR database ...
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    Image variability that is impossible or difficult to restore by intra-image processing, such as the variability caused by occlusions, significantly reduces the performance of image-recognition methods. To address this issue, we propose that the pixels associated with large distances obtained by inter-image pixel-by-pixels comparisons should be considered as inter-image outliers and should be removed from the similarity calculation used for the image classification. When this method is combined with the template-matching method for image recognition, it leads to state-of-the-art recognition performance: 91% with AR database that includes occluded face images, 90% with PUT database that includes pose variations of face images and 100% with EYale B database that includes images with large illumination variation
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    Journal Title
    Pattern Recognition
    Volume
    43
    Issue
    12
    DOI
    https://doi.org/10.1016/j.patcog.2010.07.005
    Copyright Statement
    © 2010 Elsevier. This is the author-manuscript version of this paper. Reproduced in accordance with the copyright policy of the publisher. Please refer to the journal's website for access to the definitive, published version.
    Subject
    Pattern Recognition and Data Mining
    Artificial Intelligence and Image Processing
    Information Systems
    Electrical and Electronic Engineering
    Publication URI
    http://hdl.handle.net/10072/34436
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    • Journal articles

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