The Electromagnetic Compatibility Problems of Integrated Circuits

Abstract

With the constant speed of growth in semiconductor technology, integrated circuit (IC) has taken a considerable position in an electronic system. The integrated circuit is working in a low supply voltage with high operation frequency. The internal complexity and chip density are also increased dramatically. Modern microelectronic technology in wafer fabrication easily allows component densities to exceed one million transistors per die. So far, integrated circuits are suering from various and complicated electromagnetic environments. Being the heart of an electronic system, stability and reliability of the integrated circuit are of the most important requirement along with the techniques development. The demands of high electromagnetic compatibility (EMC) performance for integrated circuits are therefore broadly spread among semiconductor manufacturers and product users. Traditionally, EMC for IC is only considered at the post-design stage. Once built, it is only then that equipment is tested to see whether or not it conforms to the relevant standards. This can prove very expensive in terms of time, cost, and the potential need for retrot modications. Simulating a piece of equipment is potentially much faster and cheaper than taking a prototype or existing piece of equipment to a test-house. More importantly, it allows the engineer to \look into" the equipment and see where currents and elds are largest; this is almost impossible with physical testing. Recently, computational electromagnetics (CEM) technique has moved from pure mathematical analysis into design in engineering practice. It can provide a much easier, faster and more economical solution of prediction in EMC characteristics than conventional methods. Thus, EMC computer modelling and simulation of IC is going to play an important role in scientic research and industrial applications.