The Electromagnetic Compatibility Problems of Integrated Circuits

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Author(s)
Primary Supervisor
Lu, Junwei
Other Supervisors
Thiel, David
Year published
2011
Metadata
Show full item recordAbstract
With the constant speed of growth in semiconductor technology, integrated
circuit (IC) has taken a considerable position in an electronic system. The
integrated circuit is working in a low supply voltage with high operation
frequency. The internal complexity and chip density are also increased
dramatically. Modern microelectronic technology in wafer fabrication
easily allows component densities to exceed one million transistors per
die. So far, integrated circuits are suering from various and complicated
electromagnetic environments. Being the heart of an electronic system,
stability and reliability of the integrated circuit ...
View more >With the constant speed of growth in semiconductor technology, integrated circuit (IC) has taken a considerable position in an electronic system. The integrated circuit is working in a low supply voltage with high operation frequency. The internal complexity and chip density are also increased dramatically. Modern microelectronic technology in wafer fabrication easily allows component densities to exceed one million transistors per die. So far, integrated circuits are suering from various and complicated electromagnetic environments. Being the heart of an electronic system, stability and reliability of the integrated circuit are of the most important requirement along with the techniques development. The demands of high electromagnetic compatibility (EMC) performance for integrated circuits are therefore broadly spread among semiconductor manufacturers and product users. Traditionally, EMC for IC is only considered at the post-design stage. Once built, it is only then that equipment is tested to see whether or not it conforms to the relevant standards. This can prove very expensive in terms of time, cost, and the potential need for retrot modications. Simulating a piece of equipment is potentially much faster and cheaper than taking a prototype or existing piece of equipment to a test-house. More importantly, it allows the engineer to \look into" the equipment and see where currents and elds are largest; this is almost impossible with physical testing. Recently, computational electromagnetics (CEM) technique has moved from pure mathematical analysis into design in engineering practice. It can provide a much easier, faster and more economical solution of prediction in EMC characteristics than conventional methods. Thus, EMC computer modelling and simulation of IC is going to play an important role in scientic research and industrial applications.
View less >
View more >With the constant speed of growth in semiconductor technology, integrated circuit (IC) has taken a considerable position in an electronic system. The integrated circuit is working in a low supply voltage with high operation frequency. The internal complexity and chip density are also increased dramatically. Modern microelectronic technology in wafer fabrication easily allows component densities to exceed one million transistors per die. So far, integrated circuits are suering from various and complicated electromagnetic environments. Being the heart of an electronic system, stability and reliability of the integrated circuit are of the most important requirement along with the techniques development. The demands of high electromagnetic compatibility (EMC) performance for integrated circuits are therefore broadly spread among semiconductor manufacturers and product users. Traditionally, EMC for IC is only considered at the post-design stage. Once built, it is only then that equipment is tested to see whether or not it conforms to the relevant standards. This can prove very expensive in terms of time, cost, and the potential need for retrot modications. Simulating a piece of equipment is potentially much faster and cheaper than taking a prototype or existing piece of equipment to a test-house. More importantly, it allows the engineer to \look into" the equipment and see where currents and elds are largest; this is almost impossible with physical testing. Recently, computational electromagnetics (CEM) technique has moved from pure mathematical analysis into design in engineering practice. It can provide a much easier, faster and more economical solution of prediction in EMC characteristics than conventional methods. Thus, EMC computer modelling and simulation of IC is going to play an important role in scientic research and industrial applications.
View less >
Thesis Type
Thesis (PhD Doctorate)
Degree Program
Doctor of Philosophy (PhD)
School
Griffith School of Engineering
Copyright Statement
The author owns the copyright in this thesis, unless stated otherwise.
Item Access Status
Public
Subject
Electromagnetic compatibility
Microelectronic technology
Integrated circuits
Computational electromagnetics