dc.contributor.advisor | Lu, Junwei | |
dc.contributor.author | Zhu, Boyuan | |
dc.date.accessioned | 2018-01-23T02:19:27Z | |
dc.date.available | 2018-01-23T02:19:27Z | |
dc.date.issued | 2011 | |
dc.identifier.doi | 10.25904/1912/2620 | |
dc.identifier.uri | http://hdl.handle.net/10072/365527 | |
dc.description.abstract | With the constant speed of growth in semiconductor technology, integrated
circuit (IC) has taken a considerable position in an electronic system. The
integrated circuit is working in a low supply voltage with high operation
frequency. The internal complexity and chip density are also increased
dramatically. Modern microelectronic technology in wafer fabrication
easily allows component densities to exceed one million transistors per
die. So far, integrated circuits are suering from various and complicated
electromagnetic environments. Being the heart of an electronic system,
stability and reliability of the integrated circuit are of the most important
requirement along with the techniques development. The demands of high
electromagnetic compatibility (EMC) performance for integrated circuits are
therefore broadly spread among semiconductor manufacturers and product
users.
Traditionally, EMC for IC is only considered at the post-design stage.
Once built, it is only then that equipment is tested to see whether or
not it conforms to the relevant standards. This can prove very expensive
in terms of time, cost, and the potential need for retrot modications.
Simulating a piece of equipment is potentially much faster and cheaper than
taking a prototype or existing piece of equipment to a test-house. More
importantly, it allows the engineer to \look into" the equipment and see
where currents and elds are largest; this is almost impossible with physical
testing. Recently, computational electromagnetics (CEM) technique has
moved from pure mathematical analysis into design in engineering practice.
It can provide a much easier, faster and more economical solution of
prediction in EMC characteristics than conventional methods. Thus, EMC
computer modelling and simulation of IC is going to play an important role
in scientic research and industrial applications. | |
dc.language | English | |
dc.publisher | Griffith University | |
dc.publisher.place | Brisbane | |
dc.rights.copyright | The author owns the copyright in this thesis, unless stated otherwise. | |
dc.subject.keywords | Electromagnetic compatibility | |
dc.subject.keywords | Microelectronic technology | |
dc.subject.keywords | Integrated circuits | |
dc.subject.keywords | Computational electromagnetics | |
dc.title | The Electromagnetic Compatibility Problems of Integrated Circuits | |
dc.type | Griffith thesis | |
gro.faculty | Science, Environment, Engineering and Technology | |
gro.rights.copyright | The author owns the copyright in this thesis, unless stated otherwise. | |
gro.hasfulltext | Full Text | |
dc.contributor.otheradvisor | Thiel, David | |
dc.rights.accessRights | Public | |
gro.identifier.gurtID | gu1340936231963 | |
gro.source.ADTshelfno | ADT0 | |
gro.source.GURTshelfno | GURT1233 | |
gro.thesis.degreelevel | Thesis (PhD Doctorate) | |
gro.thesis.degreeprogram | Doctor of Philosophy (PhD) | |
gro.department | Griffith School of Engineering | |
gro.griffith.author | Zhu, Boyuan | |