Imaging trapped ions with an integrated microfabricated optic
Abstract
We have integrated a microfabricated phase Fresnel lens (PFL) with an ion trap and used it to image a 174Yb+ ion. The observed collection efficiency was 4.1+/-1.3%, in agreement with a predicted performance of 4.6% based on optical characterization and suitable for use in quantum computing. A maximum signal to background scatter noise of 23+/-4 was measured near saturation intensity (s=0.7). The depth of focus was 11 um and the field of view in excess of 100 um across.
Conference Title
QUANTUM COMMUNICATION, MEASUREMENT AND COMPUTING (QCMC): THE TENTH INTERNATIONAL CONFERENCE
Volume
1363
Publisher URI
Copyright Statement
© 2010 American Institute of Physics. This is the author-manuscript version of this paper. Reproduced in accordance with the copyright policy of the publisher. Please refer to the conference's website for access to the definitive, published version.
Subject
Atomic and molecular physics
Quantum optics and quantum optomechanics