Imaging trapped ions with an integrated microfabricated optic
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We have integrated a microfabricated phase Fresnel lens (PFL) with an ion trap and used it to image a 174Yb+ ion. The observed collection efficiency was 4.1+/-1.3%, in agreement with a predicted performance of 4.6% based on optical characterization and suitable for use in quantum computing. A maximum signal to background scatter noise of 23+/-4 was measured near saturation intensity (s=0.7). The depth of focus was 11 um and the field of view in excess of 100 um across.
Proceedings of the 10th International Conference on Quantum Communication, Measurement and Computation 2010
© 2010 American Institute of Physics. This is the author-manuscript version of this paper. Reproduced in accordance with the copyright policy of the publisher. Please refer to the conference's website for access to the definitive, published version.
Atomic and Molecular Physics