Quantum tomography of a nonlinear photonic circuit by classical sum-frequency generation measurements
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We propose and demonstrate a new method for the characterization of nonlinear multimode integrated devices that reconstruct the biphoton state produced trough spontaneous parametric down-conversion (SPDC) using classical sum-frequency generation measurements. The proposed method is experimentally demonstrated by predicting the state generated from a multi-channel integrated nonlinear waveguide device.
2017 Conference on Lasers and Electro-Optics Pacific Rim (CLEO-PR)
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