Mechanisms of positive gate bias stress induced instabilities in power VDMOSFETs

Author(s)
Stojadinovic, N
Manic, I
Djoric-Veljkovic, S
Davidovic, V
Golubovic, S
Dimitrijev, S
Griffith University Author(s)
Year published
2001
Metadata
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Journal Title
Microelectronics Reliability
Volume
41
DOI
Subject
Electrical and Electronic Engineering
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Collection