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  • Characterization, Cathodoluminescence, and Field-Emission Properties of Morphology-Tunable CdS Micro/Nanostructures

    Author(s)
    Zhai, Tianyou
    Fang, Xiaosheng
    Bando, Yoshio
    Dierre, Benjamin
    Liu, Baodan
    Zeng, Haibo
    Xu, Xijin
    Huang, Yang
    Yuan, Xiaoli
    Sekiguchi, Takashi
    Golberg, Dmitri
    Griffith University Author(s)
    Xu, Xijin
    Year published
    2009
    Metadata
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    Abstract
    High-quality, uniform one-dimensional CdS micro/nanostructures with different morphologies-microrods, sub-microwires and nanotips-are fabricated through an easy and effective thermal evaporation process. Their structural, cathodoluminescence and field-emission properties are systematically investigated. Microrods and nanotips exhibit sharp near-bandedge emission and broad deep-level emission, whereas sub-microwires show only the deep-level emission. A significant decrease in a deep-level/nearband-edge intensity ratio is observed along a tapered nanotip towards a smaller diameter part. This behavior is understood by ...
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    High-quality, uniform one-dimensional CdS micro/nanostructures with different morphologies-microrods, sub-microwires and nanotips-are fabricated through an easy and effective thermal evaporation process. Their structural, cathodoluminescence and field-emission properties are systematically investigated. Microrods and nanotips exhibit sharp near-bandedge emission and broad deep-level emission, whereas sub-microwires show only the deep-level emission. A significant decrease in a deep-level/nearband-edge intensity ratio is observed along a tapered nanotip towards a smaller diameter part. This behavior is understood by consideration of defect concentrations in the nanotips, as analyzed with high-resolution transmission electron microscopy. Field-emission measurements show that the nanotips possess the best field-emission characteristics among all 1D CdS nanostructures reported to date, with a relatively low turn-on field of 5.28 V mm 1 and the highest field-enhancement factor of 4 819. The fieldenhancement factor, turn-on and threshold fields are discussed related to structure morphology and vacuum gap variations under emission.
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    Journal Title
    Advanced Functional Materials
    Volume
    19
    Issue
    15
    DOI
    https://doi.org/10.1002/adfm.200900295
    Subject
    Condensed Matter Characterisation Technique Development
    Physical Sciences
    Chemical Sciences
    Engineering
    Publication URI
    http://hdl.handle.net/10072/39187
    Collection
    • Journal articles

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