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dc.contributor.authorPauly, Thomas
dc.contributor.authorBondy, Aaron
dc.contributor.authorHamilton, Kathryn R
dc.contributor.authorDouguet, Nicolas
dc.contributor.authorTong, Xiao-Min
dc.contributor.authorChetty, Dashavir
dc.contributor.authorBartschat, Klaus
dc.date.accessioned2020-08-26T06:07:34Z
dc.date.available2020-08-26T06:07:34Z
dc.date.issued2020
dc.identifier.issn2469-9926
dc.identifier.doi10.1103/PhysRevA.102.013116
dc.identifier.urihttp://hdl.handle.net/10072/396800
dc.description.abstractWhen atoms or molecules are exposed to strong short-pulse infrared radiation, ionization as well as "frustrated tunneling ionization"can occur, in which some of the nearly freed electrons recombine into the initial ground or an excited bound state. We analyze the ellipticity dependence of the relative signals that are predicted in a single-active-electron (SAE) approximation, the validity of which is checked against a parameter-free multielectron R-matrix (close-coupling) with time-dependence approach. We find good agreement between the results from both models, thereby providing confidence in the SAE model potential to treat the process of interest. Comparison of the relative excitation probabilities found in our numerical calculations with the predictions of Landsman et al. [A. S. Landsman, New J. Phys. 15, 013001 (2013)NJOPFM1367-263010.1088/1367-2630/15/1/013001] and Zhao et al. [Y. Zhao, Opt. Express 27, 21689 (2019)OPEXFF1094-408710.1364/OE.27.021689] reveals good agreement with the former for short pulses. For longer pulses, the ellipticity dependence becomes wider than that obtained from the Landsman et al. formula, but we do not obtain the increase compared to linearly polarized radiation predicted by Zhao et al.
dc.description.peerreviewedYes
dc.languageEnglish
dc.language.isoeng
dc.publisherAmerican Physical Society
dc.relation.ispartofpagefrom013116
dc.relation.ispartofissue1
dc.relation.ispartofjournalPhysical Review A
dc.relation.ispartofvolume102
dc.subject.fieldofresearchAtomic, molecular and optical physics
dc.subject.fieldofresearchNuclear and plasma physics
dc.subject.fieldofresearchParticle and high energy physics
dc.subject.fieldofresearchcode5102
dc.subject.fieldofresearchcode5106
dc.subject.fieldofresearchcode5107
dc.subject.keywordsScience & Technology
dc.subject.keywordsPhysical Sciences
dc.subject.keywordsOptics
dc.titleEllipticity dependence of excitation and ionization of argon atoms by short-pulse infrared radiation
dc.typeJournal article
dc.type.descriptionC1 - Articles
dcterms.bibliographicCitationPauly, T; Bondy, A; Hamilton, KR; Douguet, N; Tong, X-M; Chetty, D; Bartschat, K, Ellipticity dependence of excitation and ionization of argon atoms by short-pulse infrared radiation, Physical Review A, 2020, 102 (1), pp. 013116
dc.date.updated2020-08-26T02:19:28Z
dc.description.versionAccepted Manuscript (AM)
gro.rights.copyright© 2020 American Physical Society. This is the author-manuscript version of this paper. Reproduced in accordance with the copyright policy of the publisher. Please refer to the journal's website for access to the definitive, published version.
gro.hasfulltextFull Text
gro.griffith.authorBartschat, Klaus
gro.griffith.authorChetty, Dash


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