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  • Frustrated tunnel ionization with few-cycle pulses

    Author(s)
    Glover, RD
    Chetty, D
    De Harak, BA
    Palmer, AJ
    Dakka, MA
    Holdsworth, JL
    Litvinyuk, IV
    Luiten, AN
    Light, PS
    Sang, RT
    Griffith University Author(s)
    Litvinyuk, Igor
    Chetty, Dash
    Palmer, Adam J.
    Sang, Robert T.
    deHarak, Bruno A.
    Glover, Rohan D.
    Year published
    2018
    Metadata
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    Abstract
    Frustrated tunnel ionization (FTI) is one of the dominant channels in strong field ionization that results in the excitation of atoms. Recent studies have shown that there is a significant number of FTI events for multi-cycle pulses with the theory predicting that the excitation efficiency increases with pulse duration decreasing into the few-cycle regime. Our work concentrates on experimentally investigating the effect of few-cycle pulses on the FTI excitation process. We use pulses with duration 6 fs centred at 800 nm at intensities up to 0.8 PW crossed with an atomic Ar beam. We find that with few-cycle pulses there is ...
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    Frustrated tunnel ionization (FTI) is one of the dominant channels in strong field ionization that results in the excitation of atoms. Recent studies have shown that there is a significant number of FTI events for multi-cycle pulses with the theory predicting that the excitation efficiency increases with pulse duration decreasing into the few-cycle regime. Our work concentrates on experimentally investigating the effect of few-cycle pulses on the FTI excitation process. We use pulses with duration 6 fs centred at 800 nm at intensities up to 0.8 PW crossed with an atomic Ar beam. We find that with few-cycle pulses there is more FTI per tunneling event and that for the same pulse energy more FTI is generated.
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    Conference Title
    Proceedings Frontiers in Optics / Laser Science
    DOI
    https://doi.org/10.1364/FIO.2018.JW3A.54
    Publication URI
    http://hdl.handle.net/10072/402714
    Collection
    • Conference outputs

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