dc.contributor.author | Afanas'ev, VV | |
dc.contributor.author | Ciobanu, F | |
dc.contributor.author | Dimitrijev, S | |
dc.contributor.author | Pensl, G | |
dc.contributor.author | Stesmans, A | |
dc.contributor.editor | Nipoti, R | |
dc.contributor.editor | Poggi, A | |
dc.contributor.editor | Scorzoni, A | |
dc.date.accessioned | 2017-05-03T11:51:37Z | |
dc.date.available | 2017-05-03T11:51:37Z | |
dc.date.issued | 2005 | |
dc.date.modified | 2007-03-19T21:53:01Z | |
dc.identifier.issn | 0255-5476 | |
dc.identifier.uri | http://hdl.handle.net/10072/4249 | |
dc.description.peerreviewed | Yes | |
dc.description.publicationstatus | Yes | |
dc.language | English | |
dc.language.iso | eng | |
dc.publisher | Trans Tech Publications | |
dc.publisher.place | Switzerland | |
dc.relation.ispartofstudentpublication | N | |
dc.relation.ispartofpagefrom | 563 | |
dc.relation.ispartofpageto | 568 | |
dc.relation.ispartofjournal | Materials Science Forum | |
dc.relation.ispartofvolume | 483-485 | |
dc.rights.retention | Y | |
dc.subject.fieldofresearch | Physical chemistry | |
dc.subject.fieldofresearch | Materials engineering | |
dc.subject.fieldofresearchcode | 3406 | |
dc.subject.fieldofresearchcode | 4016 | |
dc.title | SiC/SiO2 Interface States: Properties and Models | |
dc.type | Journal article | |
dc.type.description | C1 - Articles | |
dc.type.code | C - Journal Articles | |
gro.date.issued | 2005 | |
gro.hasfulltext | No Full Text | |
gro.griffith.author | Dimitrijev, Sima | |