Computational Electromagnetics for EMC Problems of Integrated Circuits
Author(s)
Zhu, B
Lu, J
Zhu, M
Griffith University Author(s)
Year published
2011
Metadata
Show full item recordAbstract
The computational electromagnetics (CEM) technique has moved from pure mathematical analysis into design in engineering practice, It can provide a much easier and faster solution of prediction in electromagnetic compatibility (EMC) characteristics than conventional methods. This paper presents an overall introduction and applications of CEM for the EMC problems of integrated circuits (ICs). It briefly reviews the literature covering EMC problems existing in ICs. Two applications, which involve dual die central processing unit (CPU) and internal interconnects, are provided in order to prove the capability of the CEM technique ...
View more >The computational electromagnetics (CEM) technique has moved from pure mathematical analysis into design in engineering practice, It can provide a much easier and faster solution of prediction in electromagnetic compatibility (EMC) characteristics than conventional methods. This paper presents an overall introduction and applications of CEM for the EMC problems of integrated circuits (ICs). It briefly reviews the literature covering EMC problems existing in ICs. Two applications, which involve dual die central processing unit (CPU) and internal interconnects, are provided in order to prove the capability of the CEM technique in the IC EMC area.
View less >
View more >The computational electromagnetics (CEM) technique has moved from pure mathematical analysis into design in engineering practice, It can provide a much easier and faster solution of prediction in electromagnetic compatibility (EMC) characteristics than conventional methods. This paper presents an overall introduction and applications of CEM for the EMC problems of integrated circuits (ICs). It briefly reviews the literature covering EMC problems existing in ICs. Two applications, which involve dual die central processing unit (CPU) and internal interconnects, are provided in order to prove the capability of the CEM technique in the IC EMC area.
View less >
Conference Title
Proceedings of EMC Europe 2011 York - 10th International Symposium on Electromagnetic Compatibility
Publisher URI
Subject
Microelectronics