Computational Electromagnetics for EMC Problems of Integrated Circuits
The computational electromagnetics (CEM) technique has moved from pure mathematical analysis into design in engineering practice, It can provide a much easier and faster solution of prediction in electromagnetic compatibility (EMC) characteristics than conventional methods. This paper presents an overall introduction and applications of CEM for the EMC problems of integrated circuits (ICs). It briefly reviews the literature covering EMC problems existing in ICs. Two applications, which involve dual die central processing unit (CPU) and internal interconnects, are provided in order to prove the capability of the CEM technique in the IC EMC area.
Proceedings of 10th International Symposium on Electromagnetic Compatibility 2011
Microelectronics and Integrated Circuits