Low Frequency Noise Measurement and Analysis of Capacitive Micro-Accelerometers: Temperature Effect

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Author(s)
Mohd-Yasin, F
Nagel, DJ
Ong, DS
Korman, CE
Chuah, HT
Griffith University Author(s)
Year published
2007
Metadata
Show full item recordAbstract
In this work, a noise measurement of capacitive micro-accelerometers incorporating temperature effect is presented. In the setup, a hot plate is used to heat the device up to temperatures in the 75 degree C range. A thermo couple attached to the enclosure is used to assess its temperature. The data show that the noise power increases at high temperature, but not as significant as predicted by the theory.In this work, a noise measurement of capacitive micro-accelerometers incorporating temperature effect is presented. In the setup, a hot plate is used to heat the device up to temperatures in the 75 degree C range. A thermo couple attached to the enclosure is used to assess its temperature. The data show that the noise power increases at high temperature, but not as significant as predicted by the theory.
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Conference Title
MICROPROCESSES AND NANOTECHNOLOGY 2007, DIGEST OF PAPERS
Copyright Statement
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Subject
Electrical and Electronic Engineering not elsewhere classified