Low frequency noise measurement of three-axis surface micro- machined silicon capacitive accelerometer
Abstract
The authors performed the low frequency noise measurement (LFNM) technique to study noise characteristics of commercial accelerometers with single and dual axis. In this work, we studied the noise characteristics of a three-axis accelerometer using an improved and sensitive test setup to avoid cross-axis distortion.
Conference Title
International Semiconductor Device Research Symposium, 2007. ISDRS '07
Copyright Statement
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Subject
Electrical and Electronic Engineering not elsewhere classified