Electronic properties of SiON/HfO2 insulating stacks on 4H-SiC (0001)
Author(s)
Afanas'ev, VV
Campbell, SA
Cheong, KY
Ciobanu, F
Dimitrijev, S
Pensl, G
Stesmans, A
Zhong, L
Griffith University Author(s)
Year published
2004
Metadata
Show full item recordJournal Title
Materials Science Forum
Volume
457-460
Subject
Physical chemistry
Materials engineering