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dc.contributor.authorMassoubre, David
dc.contributor.authorOudar, J.-L.
dc.contributor.authorO'Hare, Arthur
dc.contributor.authorGay, Mathilde
dc.contributor.authorBramerie, Laurent
dc.contributor.authorSimon, Jean-Claude
dc.contributor.authorShen, Alexandre
dc.contributor.authorDecobert, Jean
dc.date.accessioned2013-05-24
dc.date.accessioned2014-08-15T01:51:02Z
dc.date.accessioned2017-03-02T00:24:31Z
dc.date.available2017-03-02T00:24:31Z
dc.date.issued2006
dc.date.modified2014-08-15T01:51:02Z
dc.identifier.issn0733-8724
dc.identifier.doi10.1109/JLT.2006.879502
dc.identifier.urihttp://hdl.handle.net/10072/62264
dc.description.abstractThe limitations owing to device heating and thermo-optic effects in high-speed quantum-well microcavity saturable absorber devices are investigated both theoretically and experimentally. A simplified theoretical description of the device electronic, thermal, and optical properties is developed and applied to the modeling of the device switching characteristics for reamplification + reshaping step (2R) all-optical regeneration. These predictions are compared to nonlinear optical measurements performed with switching pulses of fixed duration and variable repetition rate on two devices with significantly different thermal properties. It is shown that proper optimization of the device thermal properties is crucial to avoid the degradation of device performance at high bit rate. It is also shown that the negative effects of optically induced heating on the switching contrast may be compensated to some extent by operating the device on the long wavelength side of the microcavity resonance.
dc.description.peerreviewedYes
dc.description.publicationstatusYes
dc.format.extent641072 bytes
dc.format.mimetypeapplication/pdf
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
dc.publisher.placeUSA
dc.relation.ispartofstudentpublicationN
dc.relation.ispartofpagefrom3400
dc.relation.ispartofpageto3408
dc.relation.ispartofissue9
dc.relation.ispartofjournalJOURNAL OF LIGHTWAVE TECHNOLOGY
dc.relation.ispartofvolume24
dc.rights.retentionY
dc.subject.fieldofresearchPhotonics, Optoelectronics and Optical Communications
dc.subject.fieldofresearchOptical Physics
dc.subject.fieldofresearchElectrical and Electronic Engineering
dc.subject.fieldofresearchCommunications Technologies
dc.subject.fieldofresearchcode020504
dc.subject.fieldofresearchcode0205
dc.subject.fieldofresearchcode0906
dc.subject.fieldofresearchcode1005
dc.titleAnalysis of thermal limitations in high-speed microcavity saturable absorber all-optical switching gates
dc.typeJournal article
dc.type.descriptionC1 - Articles
dc.type.codec1x
gro.facultyOther
gro.rights.copyright© 2006 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.
gro.hasfulltextFull Text
gro.griffith.authorMassoubre, David


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