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  • Measurement of noise characteristics of MEMS accelerometers

    Author(s)
    Mohd-Yasin, F
    Korman, CE
    Nagel, DJ
    Griffith University Author(s)
    Mohd-Yasin, Faisal
    Year published
    2003
    Metadata
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    Abstract
    The noise characteristics of microelectromechanical systems accelerometers at different accelerations are presented. The general experimental results show 1/f-type noise at low frequencies and white Gaussian noise at high frequencies. The magnitude of the noise spectral density is acceleration dependent. The results also show spectral peaks originating from the oscillators inside the accelerometers.The noise characteristics of microelectromechanical systems accelerometers at different accelerations are presented. The general experimental results show 1/f-type noise at low frequencies and white Gaussian noise at high frequencies. The magnitude of the noise spectral density is acceleration dependent. The results also show spectral peaks originating from the oscillators inside the accelerometers.
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    Journal Title
    Solid State Electronics
    Volume
    47
    DOI
    https://doi.org/10.1016/S0038-1101(02)00220-4
    Subject
    Microelectronics and Integrated Circuits
    Condensed Matter Physics
    Optical Physics
    Electrical and Electronic Engineering
    Publication URI
    http://hdl.handle.net/10072/62931
    Collection
    • Journal articles

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