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dc.contributor.authorMohd-Yasin, F
dc.contributor.authorKorman, CE
dc.contributor.authorNagel, DJ
dc.date.accessioned2012-09-10
dc.date.accessioned2014-09-17T22:30:56Z
dc.date.accessioned2017-03-02T00:44:47Z
dc.date.available2017-03-02T00:44:47Z
dc.date.issued2003
dc.date.modified2014-09-17T22:30:56Z
dc.identifier.issn0038-1101
dc.identifier.doi10.1016/S0038-1101(02)00220-4
dc.identifier.urihttp://hdl.handle.net/10072/62931
dc.description.abstractThe noise characteristics of microelectromechanical systems accelerometers at different accelerations are presented. The general experimental results show 1/f-type noise at low frequencies and white Gaussian noise at high frequencies. The magnitude of the noise spectral density is acceleration dependent. The results also show spectral peaks originating from the oscillators inside the accelerometers.
dc.description.peerreviewedYes
dc.description.publicationstatusYes
dc.languageEnglish
dc.language.isoeng
dc.publisherElsevier
dc.publisher.placeUK
dc.relation.ispartofpagefrom357
dc.relation.ispartofpageto360
dc.relation.ispartofjournalSolid State Electronics
dc.relation.ispartofvolume47
dc.subject.fieldofresearchCondensed matter physics
dc.subject.fieldofresearchAtomic, molecular and optical physics
dc.subject.fieldofresearchMicroelectronics
dc.subject.fieldofresearchcode5104
dc.subject.fieldofresearchcode5102
dc.subject.fieldofresearchcode400908
dc.titleMeasurement of noise characteristics of MEMS accelerometers
dc.typeJournal article
dc.type.descriptionC1 - Articles
dc.type.codec1x
gro.facultyFaculty of Science, Environment, Engineering and Technology
gro.hasfulltextNo Full Text
gro.griffith.authorMohd-Yasin, Faisal


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