Calibration of AFM cantilever spring constants
Author(s)
T. Gibson, Christopher
L. Weeks, Brandon
Abell, Chris
Rayment, Trevor
Myhra, Sverre
Griffith University Author(s)
Year published
2003
Metadata
Show full item recordAbstract
In this paper we present two simple, reliable and readily applicable methods for calibrating cantilevers and measuring the thickness of thin gold films. The spring constant calibration requires knowledge of the Young's modulus, density of the cantilever and resonant frequency. The thickness of thin gold layers was determined by measuring changes in the resonant frequency and Q-factor of beam shaped AFM cantilevers before and after coating. The techniques for measuring the spring constant and thin film thickness provide accuracy on the order of 10-15%.In this paper we present two simple, reliable and readily applicable methods for calibrating cantilevers and measuring the thickness of thin gold films. The spring constant calibration requires knowledge of the Young's modulus, density of the cantilever and resonant frequency. The thickness of thin gold layers was determined by measuring changes in the resonant frequency and Q-factor of beam shaped AFM cantilevers before and after coating. The techniques for measuring the spring constant and thin film thickness provide accuracy on the order of 10-15%.
View less >
View less >
Journal Title
Ultramicroscopy: journal devoted to the technical and theoretical advancement of structural research
Volume
97
Publisher URI
Copyright Statement
© 2003 Elsevier : Reproduced in accordance with the copyright policy of the publisher : This journal is available online - use hypertext links.
Subject
Atomic, Molecular, Nuclear, Particle and Plasma Physics
Optical Physics
Other Physical Sciences