The Study of Morphological Structure and Raman Spectra of 3C-SiC Membranes

Abstract

In this paper, membranes of 3C-SiC with dimensions up to 10 mm x 15 mm2 have been fabricated in epitaxial 3C-SiC/ Si wafers by the means of photolithography, reactive ion etching of 3C-SiC and wet etching of Si. Scanning electron microscope (SEM) micrographs were used to observe the structure of the membrane and the wall formed by the Si wet etching. The quality of the C-SiC membranes were observed using Raman Spectroscopy. The remains of <111> Si substrate which was unetched during the Si wet etching were presented with the formation of microstructure defects which showed distinct peaks in comparison to the high quality 3C-SiC membranes at different position. Here, the effect of the membrane fabrication procedures to the 3C-SiC membrane properties especially the morphological structure and its Raman characteristics is discussed in detail.