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dc.contributor.authorMyhra, Sverre
dc.contributor.editorD.J. O'Connor, B.A. Sexton, R.St.C. Smart
dc.date.accessioned2017-05-03T11:07:43Z
dc.date.available2017-05-03T11:07:43Z
dc.date.issued2003
dc.date.modified2007-04-12T07:53:13Z
dc.identifier.isbn3540413308
dc.identifier.doi10.1007/978-3-662-05227-3_10
dc.identifier.urihttp://hdl.handle.net/10072/642
dc.description.peerreviewedYes
dc.description.publicationstatusYes
dc.languageEnglish
dc.language.isoeng
dc.publisherSpringer-Verlag
dc.publisher.placeBerlin
dc.relation.ispartofbooktitleSurface Analysis Methods in Materials Science
dc.relation.ispartofchapter10
dc.relation.ispartofpagefrom247
dc.relation.ispartofpageto285
dc.relation.ispartofeditionSecond
dc.relation.ispartofvolume23
dc.subject.fieldofresearchcode250203
dc.titleMaterials Characterization by Scanned Probe Analysis
dc.typeBook chapter
dc.type.descriptionB1 - Chapters
dc.type.codeB - Book Chapters
gro.rights.copyright© Springer-Verlag 2003. The original publication is available at www.springer.com
gro.date.issued2003
gro.hasfulltextNo Full Text
gro.griffith.authorMyhra, Sverre


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