Mechanisms of spontaneous recovery in positive gate bias stressed power VDMSOFETs

Author(s)
Stojadinovic, N
Manic, I
Djoric-Veijkovic, S
Davidovic, V
Dankovic, D
Golubovic, S
Dimitrijev, S
Griffith University Author(s)
Year published
2002
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Journal Title
Microelectronics Reliability
Volume
42
DOI
Subject
Electrical and Electronic Engineering
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Collection