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  • The effect of strain on the electrical conductance of p-type nanocrystalline silicon carbide thin films

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    Accepted Manuscript (AM)
    Author(s)
    Hoang-Phuong, Phan
    Dzung, Viet Dao
    Wang, Li
    Toan, Dinh
    Nam-Trung, Nguyen
    Qamar, Afzaal
    Tanner, Philip
    Dimitrijev, Sima
    Zhu, Yong
    Griffith University Author(s)
    Dimitrijev, Sima
    Tanner, Philip G.
    Zhu, Yong
    Dao, Dzung V.
    Nguyen, Nam-Trung
    Year published
    2015
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    Abstract
    This paper presents for the first time the effect of strain on the electrical conductance of p-type nanocrystalline SiC grown on a Si substrate. The gauge factor of the p-type nanocrystalline SiC was found to be 14.5 which is one order of magnitude larger than that in most metals. This result indicates that mechanical strain has a significant influence on the electrical conductance of p-type nanocrystalline SiC, which is promising for mechanical sensing applications in harsh environments.This paper presents for the first time the effect of strain on the electrical conductance of p-type nanocrystalline SiC grown on a Si substrate. The gauge factor of the p-type nanocrystalline SiC was found to be 14.5 which is one order of magnitude larger than that in most metals. This result indicates that mechanical strain has a significant influence on the electrical conductance of p-type nanocrystalline SiC, which is promising for mechanical sensing applications in harsh environments.
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    Journal Title
    Journal of Materials Chemistry C
    Volume
    3
    DOI
    https://doi.org/10.1039/c4tc02679a
    Copyright Statement
    © 2015 Royal Society of Chemistry. This is the author-manuscript version of this paper. Reproduced in accordance with the copyright policy of the publisher. Please refer to the journal website for access to the definitive, published version.
    Subject
    Macromolecular and materials chemistry
    Physical chemistry
    Microelectronics
    Materials engineering
    Publication URI
    http://hdl.handle.net/10072/69162
    Collection
    • Journal articles

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