• myGriffith
    • Staff portal
    • Contact Us⌄
      • Future student enquiries 1800 677 728
      • Current student enquiries 1800 154 055
      • International enquiries +61 7 3735 6425
      • General enquiries 07 3735 7111
      • Online enquiries
      • Staff phonebook
    View Item 
    •   Home
    • Griffith Research Online
    • Journal articles
    • View Item
    • Home
    • Griffith Research Online
    • Journal articles
    • View Item
    JavaScript is disabled for your browser. Some features of this site may not work without it.

    Browse

  • All of Griffith Research Online
    • Communities & Collections
    • Authors
    • By Issue Date
    • Titles
  • This Collection
    • Authors
    • By Issue Date
    • Titles
  • Statistics

  • Most Popular Items
  • Statistics by Country
  • Most Popular Authors
  • Support

  • Contact us
  • FAQs
  • Admin login

  • Login
  • Demonstration of atomic scale stick-slip events stimulated by the force versus distance mode using atomic force microscopy

    Author(s)
    Watson, GS
    Dinte, BP
    Blach, JA
    Myhra, S
    Griffith University Author(s)
    Myhra, Sverre
    Watson, Jolanta A.
    Dinte, Bradley
    Watson, Gregory S.
    Year published
    2002
    Metadata
    Show full item record
    Abstract
    It has been shown that longitudinal deformation of the force-sensing/imposing lever can be stimulated by the conventional force versus distance (F-d), analytical mode of a scanning force microscope. Accordingly it is possible to measure simultaneously both in-plane and out-of-plane force components acting between a tip and a surface. Discrete atomic scale stick-slip events have been observed by F-d generated friction loop analysis of cleaved WTe2, Mica and HOPG single crystals, and of a Langmuir-Blodgett film. Due to the lever geometry, the lateral resolution arising from z-stage movement is better by an order of magnitude ...
    View more >
    It has been shown that longitudinal deformation of the force-sensing/imposing lever can be stimulated by the conventional force versus distance (F-d), analytical mode of a scanning force microscope. Accordingly it is possible to measure simultaneously both in-plane and out-of-plane force components acting between a tip and a surface. Discrete atomic scale stick-slip events have been observed by F-d generated friction loop analysis of cleaved WTe2, Mica and HOPG single crystals, and of a Langmuir-Blodgett film. Due to the lever geometry, the lateral resolution arising from z-stage movement is better by an order of magnitude than that obtained from translation of the x-y-stage.
    View less >
    Journal Title
    Journal of Physics D: Applied Physics
    Volume
    35
    Publisher URI
    https://iopscience.iop.org/article/10.1088/0022-3727/35/16/324
    DOI
    https://doi.org/10.1088/0022-3727/35/16/324
    Copyright Statement
    © 2002 Institute of Physics. Reproduced in accordance with the copyright policy of the publisher. This journal is available online – use hypertext links.
    Subject
    Physical sciences
    Engineering
    Publication URI
    http://hdl.handle.net/10072/7021
    Collection
    • Journal articles

    Footer

    Disclaimer

    • Privacy policy
    • Copyright matters
    • CRICOS Provider - 00233E
    • TEQSA: PRV12076

    Tagline

    • Gold Coast
    • Logan
    • Brisbane - Queensland, Australia
    First Peoples of Australia
    • Aboriginal
    • Torres Strait Islander