Low power ROM Employing Dynamic Threshold-Voltage MOSFET (DTMOS) Technique
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Mohd-Yasin, F
Khaw, MK
Reaz, MBI
Kordesch, A
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Shaari, S
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2268072 bytes
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Johor Bahru, MALAYSIA
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Abstract
This paper examines the performance of two 128-bit ROM circuits, implemented on Silterra 0.18 u CMOS process. The first circuit is built using standard NMOS transistors, runs on 0.9 V supply voltage, has gate voltage of 0.45 V and consumes 102.07 muW power. The second circuit is designed partly using Dynamic Threshold-Voltage MOSFET (DTMOS) transistors with the aim to minimize power consumption. It runs on 0.7 V supply and has gate voltage of 0.35 V. The DTMOS approach is implemented on the 128-bit ROM core and in the pull up circuit of the column decoder. The latter ROM circuitpsilas power consumption is 38.93 muW, 61.86% less than the former, at the expenses of larger die area due to the usage of deep n-well process. The standard and DTMOST circuits have the die areas of 0.139 mum2 and 0.235 mum2, respectively.
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ICSE: 2008 IEEE INTERNATIONAL CONFERENCE ON SEMICONDUCTOR ELECTRONICS, PROCEEDINGS
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© 2008 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.
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Electrical and Electronic Engineering not elsewhere classified