Measurement Models for Survivability and Competitiveness of Very Large E-Marketplace

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Measurement Models for Survivability and Competitiveness of Very Large E-Marketplace

Author(s)

Guo, Jingzhi
Sun, Chengzheng

Griffith University Author(s)

Sun, Chengzheng
Guo, Jingzhi

Date

2003

Location

St.Petersburg, Russia

Conference Title

Computational Science - ICCS 2003

Persistent link to this record

http://hdl.handle.net/10072/1748

Collections

Conference outputs