Integrated Near Field Scaning System for High Frequency Deivces
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Zhu, B
Varnoosfadeani, MV
Lu, J
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Wu Qun
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589413 bytes
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Harbin, China
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Abstract
In electromagnetic interference (EMI) applications, localization of real EMI sources in the near-field region is always in concern. This paper introduces an integrated near-field scanning system (INFSS) that handles electromagnetic near-field measurement of arbitrary 3D shape of high frequency devices in conjunction with numerical modelling and simulation results. It performs both finite element method (FEM) simulation and 3D near-field scanning function that help engineer to increase the project development efficiency and reduce the development time cost. A case study of a dual mode switch parasitic antenna is presented from design to measurement using INFSS.
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Proceedings of 3rd Asia-Pacific Conference on Antennas and Propagation, APCAP 2014
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© 2014 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.
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Electrical and Electronic Engineering not elsewhere classified