X-ray standing wave enhanced scattering from mesoporous silica thin films

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Wu, L
Liu, Y
Wang, X
Wang, G
Zhao, D
Chen, G
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2017
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Abstract

X-ray standing wave enhanced scattering effects are observed in mesoporous silica thin films (MSTFs) deposited on rough indium tin oxide coated glass substrates in grazing-incidence small-angle x-ray scattering studies. The distorted-wave Born approximation theory along with a rigorous wave function analysis is employed to elucidate the dynamical scattering processes occurring in MSTFs. The data analysis is significantly simplified by expressing the x-ray scattering intensity from MSTFs in two separate functions of the wave vector transfer, where the in-plane correlation between neighboring mesopore channels is decoupled from the out-of-plane interference interaction. Remarkable agreement is achieved between experiment and theory.

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Applied Physics Letters

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110

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4

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© 2017 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and AIP Publishing. This article appeared in Appl. Phys. Lett. 110, 041603 (2017) and may be found at https://doi.org/10.1063/1.4974922

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Physical sciences

Engineering

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Wu, L; Liu, Y; Wang, X; Wang, G; Zhao, D; Chen, G, X-ray standing wave enhanced scattering from mesoporous silica thin films, Applied Physics Letters, 2017, 110 (4), pp. 041603:1-041603:5

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