Demonstration of atomic scale stick-slip events stimulated by the force versus distance mode using atomic force microscopy

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Watson, GS
Dinte, BP
Blach, JA
Myhra, S
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2002
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Abstract

It has been shown that longitudinal deformation of the force-sensing/imposing lever can be stimulated by the conventional force versus distance (F-d), analytical mode of a scanning force microscope. Accordingly it is possible to measure simultaneously both in-plane and out-of-plane force components acting between a tip and a surface. Discrete atomic scale stick-slip events have been observed by F-d generated friction loop analysis of cleaved WTe2, Mica and HOPG single crystals, and of a Langmuir-Blodgett film. Due to the lever geometry, the lateral resolution arising from z-stage movement is better by an order of magnitude than that obtained from translation of the x-y-stage.

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Journal of Physics D: Applied Physics

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35

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© 2002 Institute of Physics. Reproduced in accordance with the copyright policy of the publisher. This journal is available online – use hypertext links.

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Physical sciences

Engineering

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