Traps at the Interface of 3C-SiC/SiO2-MOS-Structures

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Author(s)
Ciobanu, F
Pensl, G
Nagasawa, H
Schoner, A
Dimitrijev, S
Cheong, KY
Afanas'ev, VV
Wagner, G
Griffith University Author(s)
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Bergman, P

Janzen, E

Date
2002
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Materials Science Forum

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433-436

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Physical chemistry

Materials engineering

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