Convergence properties of surface conductivity characterization method for thin conductive strips

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Shahpari, M
Fumeaux, C
Thiel, DV
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2020
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Sydney, Australia

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Abstract

A new method to measure the surface conductivity σs of thin conductors has been recently proposed, that requires placement of a narrow strip inside a rectangular waveguide. Infinite series appear in the calculations required to extract σ s from the measured scattering parameters. In this paper, we explore the convergence of the different series that are associated with two choices of basis functions (uniform & cosh). We also show the impact of the series truncation on the final computed values of the complex surface conductivity of 10- j 10mS=Sq at 10GHz.

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2020 4th Australian Microwave Symposium, AMS 2020

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© 2020 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.

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Electrical engineering

Electronics, sensors and digital hardware

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Shahpari, M; Fumeaux, C; Thiel, DV, Convergence properties of surface conductivity characterization method for thin conductive strips, 2020 4th Australian Microwave Symposium, AMS 2020, 2020