Characterization of patterned and UV irradiated polyimide thin films using atomic force microscopy (AFM)
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Author(s)
Watson, Jolanta
Watson, Gregory
Brown, Chris
Myhra, Sverre
Watson, Gregory
Brown, Chris
Myhra, Sverre
Griffith University Author(s)
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Editor(s)
J. Terlet and P. Self
Date
2002
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Location
Adelaide, Australia
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Conference Title
17th Australian conference on electron microscopy,