Low Specific Contact Resistivity Nickel to Silicon Carbide Determined Using a Two Contact Circular Test Structure
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Pan, Yue
Collins, Aaron M
Leech, Patrick W
Reeves, Geoffrey K
Holland, Anthony S
Tanner, Philip
Collins, Aaron M
Leech, Patrick W
Reeves, Geoffrey K
Holland, Anthony S
Tanner, Philip
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IEEE
Date
2014
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Udine, ITALY
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2014 IEEE INTERNATIONAL CONFERENCE ON MICROELECTRONIC TEST STRUCTURES (ICMTS)
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© 2014 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.
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Biomedical instrumentation