Cyber attacks and faults discrimination in intelligent electronic device-based energy management systems
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Hossain, MJ
Anwar, A
Zaman, S
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Intelligent electronic devices (IEDs) along with advanced information and communication technology (ICT)-based networks are emerging in the legacy power grid to obtain real-time system states and provide the energy management system (EMS) with wide-area monitoring and advanced control capabilities. Cyber attackers can inject malicious data into the EMS to mislead the state estimation process and disrupt operations or initiate blackouts. A machine learning algorithm (MLA)-based approach is presented in this paper to detect false data injection attacks (FDIAs) in an IED-based EMS. In addition, stealthy construction of FDIAs and their impact on the detection rate of MLAs are analyzed. Furthermore, the impacts of natural disturbances such as faults on the system are considered, and the research work is extended to distinguish between cyber attacks and faults by using state-of-the-art MLAs. In this paper, state-of-the-art MLAs such as Random Forest, OneR, Naive Bayes, SVM, and AdaBoost are used as detection classifiers, and performance parameters such as detection rate, false positive rate, precision, recall, and f-measure are analyzed for different case scenarios on the IEEE benchmark 14-bus system. The experimental results are validated using real-time load flow data from the New York Independent System Operator (NYISO).
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Electronics (Switzerland)
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10
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6
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© 2021 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https:// creativecommons.org/licenses/by/ 4.0/), which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
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Electrical engineering
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Ruhul Amin, BM; Hossain, MJ; Anwar, A; Zaman, S, Cyber attacks and faults discrimination in intelligent electronic device-based energy management systems, Electronics (Switzerland), 2021, 10 (6), pp. 650