Frustrated tunnel ionization with few-cycle pulses

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Glover, RD
Chetty, D
De Harak, BA
Palmer, AJ
Dakka, MA
Holdsworth, JL
Litvinyuk, IV
Luiten, AN
Light, PS
Sang, RT
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2018
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Washington, DC, United States

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Abstract

Frustrated tunnel ionization (FTI) is one of the dominant channels in strong field ionization that results in the excitation of atoms. Recent studies have shown that there is a significant number of FTI events for multi-cycle pulses with the theory predicting that the excitation efficiency increases with pulse duration decreasing into the few-cycle regime. Our work concentrates on experimentally investigating the effect of few-cycle pulses on the FTI excitation process. We use pulses with duration 6 fs centred at 800 nm at intensities up to 0.8 PW crossed with an atomic Ar beam. We find that with few-cycle pulses there is more FTI per tunneling event and that for the same pulse energy more FTI is generated.

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Proceedings Frontiers in Optics / Laser Science

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Glover, RD; Chetty, D; De Harak, BA; Palmer, AJ; Dakka, MA; Holdsworth, JL; Litvinyuk, IV; Luiten, AN; Light, PS; Sang, RT, Frustrated tunnel ionization with few-cycle pulses, Proceedings Frontiers in Optics / Laser Science, 2018